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Time-Mode Analog-to-Digital Conversion Using Standard Cells

机译:使用标准单元的时间模式模数转换

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摘要

Synthesizable all-digital ADCs that can be designed, verified and taped out using a digital design flow are of interest due to a consequent reduction in design cost and an improved technology portability. As a step towards high performance synthesizable ADCs built using generic and low accuracy components, an ADC designed exclusively with standard digital cell library components is presented. The proposed design is a time-mode circuit employing a VCO based multi-bit quantizer. The ADC has first order noise-shaping due to inherent error feedback of the oscillator and sinc anti-aliasing filtering due to continuous-time sampling. The proposed architecture employs a Gray-counter based quantizer design, which mitigates the problem of partial sampling of digital data in multi-bit VCO-based quantizers. Furthermore, digital correction employing polynomial-fit estimation is proposed to correct for VCO non-linearity. The design occupies 0.026 mm when fabricated in a 65 nm CMOS process and delivers an ENOB of 8.1 bits over a signal bandwidth of 25.6 MHz, while sampling at 205 MHz. The performance is comparable to that of recently reported custom designed single-ended open-loop VCO-based ADCs, while being designed exclusively with standard cells, and consuming relatively low average power of 3.3 mW achieving an FoM of 235 fJ/step.
机译:由于可以降低设计成本并提高技术的可移植性,因此可以使用数字设计流程进行设计,验证和分流的可合成全数字ADC受到关注。作为向使用通用和低精度组件构建的高性能可合成ADC迈出的一步,提出了一种专门与标准数字单元库组件一起设计的ADC。所提出的设计是采用基于VCO的多位量化器的时间模式电路。由于振荡器固有的误差反馈,ADC具有一阶噪声整形;由于连续时间采样,ADC具有正弦抗混叠滤波。所提出的体系结构采用基于灰度计数器的量化器设计,这减轻了在基于多位VCO的量化器中对数字数据进行部分采样的问题。此外,提出了采用多项式拟合估计的数字校正来校正VCO非线性。当采用65 nm CMOS工艺制造时,该设计占用0.026 mm的空间,并在25.6 MHz的信号带宽上提供8.1位的ENOB,同时在205 MHz下采样。该性能可与最近报道的定制设计的基于单端开环VCO的ADC媲美,同时专门针对标准单元进行设计,并且平均功耗仅为3.3 mW,相对较低,FOM为235 fJ / step。

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